"Special Feature: Semiconductor Memory Reliability with Error Detecting and ..."

Len Levine, Ware Myers (1976)

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DOI: 10.1109/C-M.1976.218410

access: closed

type: Journal Article

metadata version: 2020-08-12

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Len Levine, Ware Myers:
Special Feature: Semiconductor Memory Reliability with Error Detecting and Correcting Codes. Computer 9(10): 43-50 (1976)

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