"Voltage, Throughput, Power, Reliability, and Multicore Scaling."

Fei Xia et al. (2017)

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DOI: 10.1109/MC.2017.3001246

access: closed

type: Journal Article

metadata version: 2025-03-03

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Fei Xia, Ashur Rafiev, Ali Aalsaud, Mohammed A. Noaman Al-Hayanni, James J. Davis, Joshua M. Levine, Andrey Mokhov, Alexander B. Romanovsky, Rishad A. Shafik, Alex Yakovlev, Sheng Yang:
Voltage, Throughput, Power, Reliability, and Multicore Scaling. Computer 50(8): 34-45 (2017)

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