Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"EPIC: Efficient prediction of IC manufacturing hotspots with a unified ..."

Duo Ding et al. (2014)

> Home

Details and statistics

DOI: —

access: open

type: Informal or Other Publication

metadata version: 2018-08-13

- view
  - electronic edition @ arxiv.org (open access)
- export record
  dblp key:
  - journals/corr/DingYGP14
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/corr/DingYGP14
Duo Ding, Bei Yu, Joydeep Ghosh, David Z. Pan:
EPIC: Efficient prediction of IC manufacturing hotspots with a unified meta-classification formulation. CoRR abs/1402.2904 (2014)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.