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"Heuristic approach to optimize the number of test cases for simple circuits"

S. M. Thamarai, Kuppusamy Krishnamoorthy, T. Meyyappan (2010)

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DOI: —

access: open

type: Informal or Other Publication

metadata version: 2021-11-18

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  - electronic edition @ arxiv.org (open access)
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  dblp key:
  - journals/corr/abs-1009-6186
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  persistent URL:
  - https://dblp.org/rec/journals/corr/abs-1009-6186
S. M. Thamarai, Kuppusamy Krishnamoorthy, T. Meyyappan:
Heuristic approach to optimize the number of test cases for simple circuits. CoRR abs/1009.6186 (2010)

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