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"Advanced Methods for the Optical Quality Assurance of Silicon Sensors."

Evgeny Lavrik, Iaroslav Panasenko, Hans Rudolf Schmidt (2018)

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DOI: —

access: open

type: Informal or Other Publication

metadata version: 2018-08-13

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  - electronic edition @ arxiv.org (open access)
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  dblp key:
  - journals/corr/abs-1807-00211
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  persistent URL:
  - https://dblp.org/rec/journals/corr/abs-1807-00211
Evgeny Lavrik, Iaroslav Panasenko, Hans Rudolf Schmidt:
Advanced Methods for the Optical Quality Assurance of Silicon Sensors. CoRR abs/1807.00211 (2018)

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