"Measuring Patent Claim Generation by Span Relevancy."

Jieh-Sheng Lee, Jieh Hsiang (2019)

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DOI: —

access: open

type: Informal or Other Publication

metadata version: 2019-08-29

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  - electronic edition @ arxiv.org (open access)
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  dblp key:
  - journals/corr/abs-1908-09591
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  persistent URL:
  - https://dblp.org/rec/journals/corr/abs-1908-09591
Jieh-Sheng Lee, Jieh Hsiang:
Measuring Patent Claim Generation by Span Relevancy. CoRR abs/1908.09591 (2019)

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