"Optimizing the Efficiency of Accelerated Reliability Testing for the ..."

Hanxiao Zhang, Shouzhou Liu, Yan-Fu Li (2020)

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DOI: —

access: open

type: Informal or Other Publication

metadata version: 2020-01-17

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  - electronic edition @ arxiv.org (open access)
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  dblp key:
  - journals/corr/abs-2001-03442
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  persistent URL:
  - https://dblp.org/rec/journals/corr/abs-2001-03442
Hanxiao Zhang, Shouzhou Liu, Yan-Fu Li:
Optimizing the Efficiency of Accelerated Reliability Testing for the Internet Router Motherboard. CoRR abs/2001.03442 (2020)

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