"New Analysis to Measure the Capacitance and Conductance of MOS Structure ..."

Wagah Farman Mohammad (2011)

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DOI: 10.4236/CS.2011.23022

access: open

type: Journal Article

metadata version: 2020-06-08

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Wagah Farman Mohammad:
New Analysis to Measure the Capacitance and Conductance of MOS Structure toward Small Size of VLSI Circuits. Circuits Syst. 2(3): 145-150 (2011)

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