"A Comprehensive Survey on Machine Learning Driven Material Defect Detection."

Jun Bai et al. (2025)

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DOI: 10.1145/3730576

access: closed

type: Journal Article

metadata version: 2025-08-09

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Jun Bai, Di Wu, Tristan Shelley, Peter Schubel, David Twine, John Russell, Xuesen Zeng, Ji Zhang:
A Comprehensive Survey on Machine Learning Driven Material Defect Detection. ACM Comput. Surv. 57(11): 275:1-275:36 (2025)

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