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"Test data compression for digital circuits using tetrad state skip scheme."

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DOI: 10.1007/S10617-017-9196-6

access: closed

type: Withdrawn Item

metadata version: 2022-05-11

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(Withdrawn) Test data compression for digital circuits using tetrad state skip scheme. Des. Autom. Embed. Syst. 21(3-4): 197-211 (2017)

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