"Nondestructive defect inspection for LCDs using optical coherence tomography."

Su Hwan Kim, Jee-Hyun Kim, Shin-Won Kang (2011)

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DOI: 10.1016/J.DISPLA.2011.04.002

access: closed

type: Journal Article

metadata version: 2017-05-17

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Su Hwan Kim, Jee-Hyun Kim, Shin-Won Kang:
Nondestructive defect inspection for LCDs using optical coherence tomography. Displays 32(5): 325-329 (2011)

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