"Analysis of the dependence of indium-gallium-zinc oxide thin-film ..."

Jae-Chul Park, Tae Kwang Park, Ho-Nyeon Lee (2015)

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DOI: 10.1016/J.DISPLA.2015.09.003

access: closed

type: Journal Article

metadata version: 2022-10-02

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Jae-Chul Park, Tae Kwang Park, Ho-Nyeon Lee:
Analysis of the dependence of indium-gallium-zinc oxide thin-film transistor properties on the gate interface material using a two-stack gate-insulator structure. Displays 39: 100-103 (2015)

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