"Guest Editor's Introduction: ITC Helps Get More Out of Test."

Kenneth M. Butler (2006)

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DOI: 10.1109/MDT.2006.120

access: closed

type: Journal Article

metadata version: 2020-05-17

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Kenneth M. Butler:
Guest Editor's Introduction: ITC Helps Get More Out of Test. IEEE Des. Test Comput. 23(5): 388-389 (2006)

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