"Scan Integrity Tests for EDT Compression."

Wu-Tung Cheng et al. (2020)

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DOI: 10.1109/MDAT.2020.2968271

access: closed

type: Journal Article

metadata version: 2021-10-14

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Wu-Tung Cheng, Grzegorz Mrugalski, Janusz Rajski, Maciej Trawka, Jerzy Tyszer:
Scan Integrity Tests for EDT Compression. IEEE Des. Test 37(4): 21-26 (2020)

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