"Scan design at NEC."

Shigehiro Funatsu, Masato Kawai, Akihiko Yamada (1989)

> Home

Details and statistics

DOI: 10.1109/54.32412

access: closed

type: Journal Article

metadata version: 2021-03-01

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/dt/FunatsuKY89
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/dt/FunatsuKY89
Shigehiro Funatsu, Masato Kawai, Akihiko Yamada:
Scan design at NEC. IEEE Des. Test 6(3): 50-51 (1989)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.