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"Extracting Defect Density and Size Distributions from Product ICs."
Jeffrey E. Nelson et al. (2006)
- Jeffrey E. Nelson, Thomas Zanon, Jason G. Brown, Osei Poku, R. D. (Shawn) Blanton, Wojciech Maly, Brady Benware, Chris Schuermyer:
Extracting Defect Density and Size Distributions from Product ICs. IEEE Des. Test Comput. 23(5): 390-400 (2006)
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