"Benefits of a SoC-Specific Test Methodology."

Md. Saffat Quasem, Zhigang Jiang, Sandeep K. Gupta (2003)

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DOI: 10.1109/MDT.2003.1198688

access: closed

type: Journal Article

metadata version: 2023-09-21

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  - https://dblp.org/rec/journals/dt/QuasemJG03
Md. Saffat Quasem, Zhigang Jiang, Sandeep K. Gupta:
Benefits of a SoC-Specific Test Methodology. IEEE Des. Test Comput. 20(3): 68-77 (2003)

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