"A Yield Enhancement Methodology for Custom VLSI Manufacturing."

Randall S. Collica et al. (1992)

> Home

Details and statistics

DOI: —

access: open

type: Journal Article

metadata version: 2023-01-23

- view
  - electronic edition @ hp.com (open access)
- export record
  dblp key:
  - journals/dtj/CollicaDLL92
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/dtj/CollicaDLL92
Randall S. Collica, X. Joseph Dietrich, Rudolf Lambrecht Jr., David G. Lau:
A Yield Enhancement Methodology for Custom VLSI Manufacturing. Digit. Tech. J. 4(2): 83-99 (1992)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.