"Fabric defect detection via Explicit De-Background."

Yuntao Chen, Hao Liu, Jiuzhen Liang (2025)

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DOI: 10.1016/J.ENGAPPAI.2025.111708

access: closed

type: Journal Article

metadata version: 2025-09-10

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Yuntao Chen, Hao Liu, Jiuzhen Liang:
Fabric defect detection via Explicit De-Background. Eng. Appl. Artif. Intell. 159: 111708 (2025)

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