"Surface defect detection using distributed features."

The Van Le et al. (2025)

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DOI: 10.1016/J.ENGAPPAI.2025.110655

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type: Journal Article

metadata version: 2025-05-09

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The Van Le, Jordan Daniel Joshua, Taehwan Kim, Jinhyuk Lee, Seong Han Kim, Jin Young Lee:
Surface defect detection using distributed features. Eng. Appl. Artif. Intell. 151: 110655 (2025)

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