"Semi-supervised dual-constraint centroid contrastive prototypical network ..."

Yunxia Lou et al. (2025)

> Home

Details and statistics

DOI: 10.1016/J.ENGAPPAI.2025.111163

access: closed

type: Journal Article

metadata version: 2025-07-04

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/eaai/LouSGZLP25
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/eaai/LouSGZLP25
Yunxia Lou, Lei Su, Jiefei Gu, Xinwei Zhao, Ke Li, Michael G. Pecht:
Semi-supervised dual-constraint centroid contrastive prototypical network for flip chip defect detection under limited labeled data. Eng. Appl. Artif. Intell. 156: 111163 (2025)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.