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"Local-global lightweight ViT model for mini/micro-LED-chip defect recognition."

Linyu Wei et al. (2023)

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DOI: 10.1016/J.ENGAPPAI.2023.106247

access: closed

type: Journal Article

metadata version: 2023-10-14

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Linyu Wei, Jueping Cai, Kailin Wen, Chengkai Zhang:
Local-global lightweight ViT model for mini/micro-LED-chip defect recognition. Eng. Appl. Artif. Intell. 123(Part A): 106247 (2023)

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