"The end-to-end chip surface defect segmentation method based on the ..."

Zilin Xia et al. (2025)

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DOI: 10.1016/J.ENGAPPAI.2025.111131

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type: Journal Article

metadata version: 2025-08-15

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Zilin Xia, Yufan Zhao, Jinan Gu, Wenbo Wang, Zedong Huang, Yan Gao, Peiyue Sun:
The end-to-end chip surface defect segmentation method based on the diffusion model and attention mechanism. Eng. Appl. Artif. Intell. 155: 111131 (2025)

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