"Energy and Reliability Improvement of Voltage-Based, Clustered, ..."

Hassan Afzali-Kusha et al. (2018)

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DOI: 10.1109/JETCAS.2018.2856838

access: closed

type: Journal Article

metadata version: 2018-10-03

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Hassan Afzali-Kusha, Omid Akbari, Mehdi Kamal, Massoud Pedram:
Energy and Reliability Improvement of Voltage-Based, Clustered, Coarse-Grain Reconfigurable Architectures by Employing Quality-Aware Mapping. IEEE J. Emerg. Sel. Topics Circuits Syst. 8(3): 480-493 (2018)

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