"Scalable In-Memory Clustered Annealer With Temporal Noise of Charge Trap ..."

Anni Lu et al. (2023)

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DOI: 10.1109/JETCAS.2023.3244485

access: closed

type: Journal Article

metadata version: 2024-08-17

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Anni Lu, Jae Hur, Yuan-Chun Luo, Hai Li, Dmitri E. Nikonov, Ian A. Young, Yang-Kyu Choi, Shimeng Yu:
Scalable In-Memory Clustered Annealer With Temporal Noise of Charge Trap Transistor for Large Scale Travelling Salesman Problems. IEEE J. Emerg. Sel. Topics Circuits Syst. 13(1): 422-435 (2023)

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