"Resilience assessment of Chinese semiconductor enterprises based on a ..."

Qi Ding et al. (2026)

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DOI: 10.1016/J.ESWA.2025.129588

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type: Journal Article

metadata version: 2025-09-28

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Qi Ding, Xinping Xiao, Xiulin Geng, Lin Luo:
Resilience assessment of Chinese semiconductor enterprises based on a novel grey wavelet neural differential dynamics model. Expert Syst. Appl. 297: 129588 (2026)

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