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"A real-time anchor-free defect detector with global and local feature ..."

Qing Liu et al. (2024)

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DOI: 10.1016/J.ESWA.2024.123199

access: closed

type: Journal Article

metadata version: 2024-05-31

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Qing Liu, Min Liu, Q. M. Jonathan Wu, Weiming Shen:
A real-time anchor-free defect detector with global and local feature enhancement for surface defect detection. Expert Syst. Appl. 246: 123199 (2024)

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