"Methodical Approach for Immunity Assessment of Electronic Devices Excited ..."

Vladimir Chepelev et al. (2018)

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DOI: 10.1007/S10836-018-5749-2

access: closed

type: Journal Article

metadata version: 2020-09-11

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Vladimir Chepelev, Yury Parfenov, William Radasky, Boris Titov, Leonid Zdoukhov, Kejie Li, Yuhao Chen, Xu Kong, Yan-zhao Xie:
Methodical Approach for Immunity Assessment of Electronic Devices Excited by High Power EMP. J. Electron. Test. 34(5): 547-557 (2018)

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