"IC Immunity Modeling Process Validation Using On-Chip Measurements."

Sonia Ben Dhia et al. (2012)

> Home

Details and statistics

DOI: 10.1007/S10836-012-5294-3

access: closed

type: Journal Article

metadata version: 2020-09-11

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/et/DhiaBVD12
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/et/DhiaBVD12
Sonia Ben Dhia, Alexandre Boyer, Bertrand Vrignon, Mikaël Deobarro:
IC Immunity Modeling Process Validation Using On-Chip Measurements. J. Electron. Test. 28(3): 339-348 (2012)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.