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"A Ring Architecture Strategy for BIST Test Pattern Generation."

Christophe Fagot et al. (2003)

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DOI: 10.1023/A:1023788727542

access: closed

type: Journal Article

metadata version: 2022-10-02

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Christophe Fagot, Olivier Gascuel, Patrick Girard, Christian Landrault:
A Ring Architecture Strategy for BIST Test Pattern Generation. J. Electron. Test. 19(3): 223-231 (2003)

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