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"Measurement of Nonlinear Dielectric Behaviour of Semiconductor Material ..."

Yong Gao, En Li, Gaofeng Guo (2018)

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DOI: 10.1007/S10836-018-5718-9

access: closed

type: Journal Article

metadata version: 2020-09-11

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  - https://dblp.org/rec/journals/et/GaoLG18
Yong Gao, En Li, Gaofeng Guo:
Measurement of Nonlinear Dielectric Behaviour of Semiconductor Material Under Microwave Field in Dual-Mode Rectangular Cavity. J. Electron. Test. 34(2): 203-207 (2018)

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