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"Data Invalidation Analysis for Scan-Based Debug on Multiple-Clock System ..."

Sandeep Kumar Goel, Bart Vermeulen (2003)

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DOI: 10.1023/A:1024639925852

access: closed

type: Journal Article

metadata version: 2020-09-11

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Sandeep Kumar Goel, Bart Vermeulen:
Data Invalidation Analysis for Scan-Based Debug on Multiple-Clock System Chips. J. Electron. Test. 19(4): 407-416 (2003)

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