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"Efficient Error-Tolerability Testing on Image Processing Circuits Based on ..."
Tong-Yu Hsieh, Yi-Han Peng, Kuan-Hsien Li (2014)
- Tong-Yu Hsieh, Yi-Han Peng, Kuan-Hsien Li:
Efficient Error-Tolerability Testing on Image Processing Circuits Based on Equivalent Error Rate Transformation. J. Electron. Test. 30(6): 687-699 (2014)
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