Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Embedded RF Circuit Diagnostic Technique with Multi-Tone Dither Scheme."

Sukeshwar Kannan et al. (2011)

> Home

Details and statistics

DOI: 10.1007/S10836-011-5212-0

access: closed

type: Journal Article

metadata version: 2020-09-11

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/et/KannanKSTAF11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/et/KannanKSTAF11
Sukeshwar Kannan, Bruce C. Kim, Ganesh Srinivasan, Friedrich Taenzler, Richard Antley, Craig Force:
Embedded RF Circuit Diagnostic Technique with Multi-Tone Dither Scheme. J. Electron. Test. 27(3): 241-252 (2011)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.