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"ICCQ: A Test Method for Analogue VLSI Using Local Current Sensors."

Joop P. M. Van Lammeren (1999)

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DOI: 10.1023/A:1008341120580

access: closed

type: Journal Article

metadata version: 2020-09-11

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Joop P. M. Van Lammeren:
ICCQ: A Test Method for Analogue VLSI Using Local Current Sensors. J. Electron. Test. 14(1-2): 33-38 (1999)

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