"Failure Analysis and Power-on Sequence Optimization for InP DHBT Stacked ..."

Yao Li et al. (2025)

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DOI: 10.1007/S10836-025-06192-4

access: closed

type: Journal Article

metadata version: 2025-10-31

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Yao Li, Yan Gao, GuoZhen Hu, Guoqing Huang, Liang Zhao, Yan Sun, Weihua Yu:
Failure Analysis and Power-on Sequence Optimization for InP DHBT Stacked Amplifiers. J. Electron. Test. 41(4): 431-439 (2025)

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