"Testing and Diagnosis Methodologies for Embedded Content Addressable Memories."

Jin-Fu Li, Ruey-Shing Tzeng, Cheng-Wen Wu (2003)

> Home

Details and statistics

DOI: 10.1023/A:1022858128485

access: closed

type: Journal Article

metadata version: 2023-10-17

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/et/LiTW03
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/et/LiTW03
Jin-Fu Li, Ruey-Shing Tzeng, Cheng-Wen Wu:
Testing and Diagnosis Methodologies for Embedded Content Addressable Memories. J. Electron. Test. 19(2): 207-215 (2003)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.