"Embedded System Level Self-Test for Mixed-Signal IO Verification."

V. Loukusa (2006)

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DOI: 10.1007/S10836-006-9458-X

access: closed

type: Journal Article

metadata version: 2020-09-11

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V. Loukusa:
Embedded System Level Self-Test for Mixed-Signal IO Verification. J. Electron. Test. 22(4-6): 463-470 (2006)

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