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"On-Wafer Calibration Technique for High Frequency Measurement with ..."

B. M. Farid Rahman et al. (2015)

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DOI: 10.1007/S10836-014-5496-Y

access: closed

type: Journal Article

metadata version: 2021-09-22

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  - https://dblp.org/rec/journals/et/RahmanPWXW15
B. M. Farid Rahman, Yujia Peng, TengXing Wang, Tian Xia, Guoan Wang:
On-Wafer Calibration Technique for High Frequency Measurement with Simultaneous Voltage and Current Tuning. J. Electron. Test. 31(1): 67-73 (2015)

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