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"Component Value Calculations and Characterizations for Measurements in the ..."

Teuvo Saikkonen, Markku Moilanen (2007)

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DOI: 10.1007/S10836-007-5008-4

access: closed

type: Journal Article

metadata version: 2020-09-11

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Teuvo Saikkonen, Markku Moilanen:
Component Value Calculations and Characterizations for Measurements in the IEEE 1149.4 Environment. J. Electron. Test. 23(6): 569-579 (2007)

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