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"Extended selection of switching target faults in CONT algorithm for test ..."

Yuzo Takamatsu, Kozo Kinoshita (1990)

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DOI: 10.1007/BF00153855

access: closed

type: Journal Article

metadata version: 2020-09-11

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Yuzo Takamatsu, Kozo Kinoshita:
Extended selection of switching target faults in CONT algorithm for test generation. J. Electron. Test. 1(3): 183-189 (1990)

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