"Enhanced Reduced Pin-Count Test for Full-Scan Design."

Harald P. E. Vranken et al. (2002)

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DOI: 10.1023/A:1014989408897

access: closed

type: Journal Article

metadata version: 2020-09-11

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Harald P. E. Vranken, Tom Waayers, Hérvé Fleury, David Lelouvier:
Enhanced Reduced Pin-Count Test for Full-Scan Design. J. Electron. Test. 18(2): 129-143 (2002)

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