Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"An Efficient Compatibility-Based Test Data Compression and Its Decoder ..."

Min-yong Wan et al. (2011)

> Home

Details and statistics

DOI: 10.1007/S10836-011-5258-Z

access: closed

type: Journal Article

metadata version: 2020-09-11

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/et/WanDPY11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/et/WanDPY11
Min-yong Wan, Yong Ding, Yun Pan, Xiaolang Yan:
An Efficient Compatibility-Based Test Data Compression and Its Decoder Architecture. J. Electron. Test. 27(6): 787-796 (2011)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.