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"A New Test Point Selection Method for Analog Circuit."

Dongsheng Zhao, Yuzhu He (2015)

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DOI: 10.1007/S10836-015-5506-8

access: closed

type: Journal Article

metadata version: 2020-09-11

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  - https://dblp.org/rec/journals/et/ZhaoH15
Dongsheng Zhao, Yuzhu He:
A New Test Point Selection Method for Analog Circuit. J. Electron. Test. 31(1): 53-66 (2015)

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