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"VLSI reliability: Contributions from a three year national research program."

Giovanni Soncini et al. (1990)

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DOI: 10.1002/ETT.4460010221

access: closed

type: Journal Article

metadata version: 2020-05-18

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  - journals/ett/SonciniCZCDFMMM90
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  - https://dblp.org/rec/journals/ett/SonciniCZCDFMMM90
Giovanni Soncini, Claudio Canali, Enrico Zanoni, Francrsco Cors, Alessandro Diligenti, Fausto Fantini, Vito A. Monaco, Guido Masetti, Carlo Morandi:
VLSI reliability: Contributions from a three year national research program. Eur. Trans. Telecommun. 1(2): 209-220 (1990)

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