"SOM-Optimized Neurofuzzy Classifiers for Measuring Expatriation Willingness."

Jieh-Haur Chen et al. (2017)

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DOI: 10.1109/MIS.2017.3711643

access: closed

type: Journal Article

metadata version: 2020-03-06

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  - https://dblp.org/rec/journals/expert/ChenSLH17
Jieh-Haur Chen, Mu-Chun Su, Shang-I Lin, De-Yuan Huang:
SOM-Optimized Neurofuzzy Classifiers for Measuring Expatriation Willingness. IEEE Intell. Syst. 32(5): 28-34 (2017)

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