"DeepCLEM: automated registration for correlative light and electron ..."

Rick Seifert et al. (2020)

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DOI: 10.12688/F1000RESEARCH.27158.1

access: open

type: Informal or Other Publication

metadata version: 2025-01-19

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Rick Seifert, Sebastian M. Markert, Sebastian Britz, Veronika Perschin, Christoph Erbacher, Christian Stigloher, Philip Kollmannsberger:
DeepCLEM: automated registration for correlative light and electron microscopy using deep learning. F1000Research 9: 1275 (2020)

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