"Study of the Vth shift of the thin-film transistor by the bias ..."

Yukinobu Fujimoto (1992)

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DOI: 10.1147/RD.361.0076

access: closed

type: Journal Article

metadata version: 2020-03-13

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Yukinobu Fujimoto:
Study of the V_th shift of the thin-film transistor by the bias temperature stress test. IBM J. Res. Dev. 36(1): 76-82 (1992)

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