"Yield Model for Productivity Optimization of VLSI Memory Chips with ..."

Charles H. Stapper, A. N. McLaren, M. Dreckmann (1980)

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DOI: 10.1147/RD.243.0398

access: closed

type: Journal Article

metadata version: 2020-05-12

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Charles H. Stapper, A. N. McLaren, M. Dreckmann:
Yield Model for Productivity Optimization of VLSI Memory Chips with Redundancy and Partially Good Product. IBM J. Res. Dev. 24(3): 398-409 (1980)

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