"Significance of depth of inspection and inspection performance metrics for ..."

T. R. Gopalakrishnan Nair, V. Suma, Pranesh Kumar Tiwari (2012)

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DOI: 10.1049/IET-SEN.2011.0148

access: closed

type: Journal Article

metadata version: 2020-05-22

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T. R. Gopalakrishnan Nair, V. Suma, Pranesh Kumar Tiwari:
Significance of depth of inspection and inspection performance metrics for consistent defect management in software industry. IET Softw. 6(6): 524-535 (2012)

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